Data Curation and Analysis for Semiconductor Device Research
TimeTuesday, July 306:30pm - 8:30pm
LocationCrystal Foyer and Crystal B
DescriptionThe process of fabricating and characterizing a semiconductor device can be tedious, in part because of the copious amount of variables that contribute to the final outcome. Proper documentation of process parameters, physical device progress, and preliminary data is crucial to fine-tuning the fabrication recipe and creating a quality device. A secure database system designed with this documentation in mind greatly improves the fabrication workflow. By allowing the database to connect with a networked instance of Jupyter Notebook, the processing of intermediate data is further streamlined. Future improvements planned for the system include utilizing the advanced computational methods such as image classification and object detection to identify connections between process parameters and results that are difficult for an individual to identify.